Onyx is continuously improving its features, offering new results, highly increasing its potential. Now, its 4.0 version incorporates two new characterization models to its previous capabilities: Semiconductor Thin Film Model and Two-Thickness Substrate Model. These new features expand the system’s versatility and make it an ideal platform for researching an even wider variety of materials.
In just one single measurement, the system is able to provide precisely the following physical properties:
das-Nano collaborated on the GRACE EUROPEAN Project (EMPIR-EURAMET program), developing electrical characterization methods for future graphene electronics, such as Terahertz technology used by the Onyx device.
A Good Practice Guide on the Electrical characterisation of graphene using non-contact and high-throughput methods was published within the project.
Weight: 46 Kg.
Dimensions: 610 x 581 x 332 mm.
Weight: 2 Kg.
Dimensions: 260 x 176 x 67 mm.
Voltage: 230 VAC, <200 W.
Connections: USB, HDMI & Ethernet.
Weight: 27 Kg.
Dimensions: 546 x 401 x 535.5 mm.
ISO 9001 certified
ISO 27001 certified
CE marking (EU)
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