Onyx

Terahertz research platform for bulk, thin films and 2D materials

The first system in the market designed to provide a full-area non-destructive electrical characterization of:

Onyx covers the gap between the macro and the nano scale tools characterizing from 0,5 mm² to large areas (m²), enhancing the industrialization of the research materials.
Compared to other large-area methods, such as the four-probe methods, Onyx is capable to measure the spatial distribution of the quality of the sample. Spatial resolution in the order of a few hundreds of microns enables the fast characterization of large areas of sample as opposed to microscopic methods such as Raman, SEM, and TEM.

das-Nano has 19 patents in different technological fields, such as terahertz technology, artificial intelligence, and nanotechnology. Of these patents, 12 explicitly protect the innovations carried out in the field of terahertz technology.
Onyx system complies with the IEC TS 62607-6-10:2021 technical specification, published by the International Electrotechnical Commision (IEC). The IEC TS 62607-6-10:2021 deals with the sheet resistance measurement of graphene-based materials using terahertz time-domain spectroscopy.

Updating and improving its features

Onyx is continuously improving its features, offering new results, highly increasing its potential. Now, its 4.0 version incorporates two new characterization models to its previous capabilities: Semiconductor Thin Film Model and Two-Thickness Substrate Model. These new features expand the system’s versatility and make it an ideal platform for researching an even wider variety of materials.

In just one single measurement, the system is able to provide precisely the following physical properties:

Onyx in the GRACE Project

Developing electrical characterization methods for future graphene electronics

das-Nano collaborated on the GRACE EUROPEAN Project (EMPIR-EURAMET program), developing electrical characterization methods for future graphene electronics, such as Terahertz technology used by the Onyx device.

A Good Practice Guide on the Electrical characterisation of graphene using non-contact and high-throughput methods was published within the project.