das-Nano is happy to share the publication of the article “Direct growth of wafer-scale highly oriented graphene on sapphire” in the Science Advances journal, which holds an impact factor of 14.
The article includes results of the graphene’s electrical mobility characterization with terahertz time-domain spectroscopy (THz-TDS), measured with das-Nano’s Onyx equipment.
Onyx is the first system in the market designed to provide a full-area non-destructive characterization of Graphene, thin films, and other 2D materials.
You can read the full article here.
