The Graphene Flagship Annual Report 2020 has dedicated one page to das-Nano’s Onyx.
Onyx is the first system on the market designed to provide full-area, non-destructive characterisation of graphene, thin films and other layered materials. Onyx covers the gap between the macroscale and the nanoscale, characterising areas from millimetres squared to metres squared, accelerating the industrialisation of materials like graphene and layered materials. It can record spatial resolutions of a few hundreds of microns, enabling the fast characterisation of large sample areas – as opposed to typical microscopic methods like Raman and scanning electron microscopy.
Click here to read the complete Annual Report!
