Full-area non-destructive Graphene electrical characterization

Do you need to measure the electrical properties and 2D materials quickly and non-destructively?

Do you want a contactless system capable of measuring the spatial distribution of the sample quality?

With das-Nano Onyx solution, you can achieve non-destructive electrical characterization of the entire graphene area and much more!

How does it work?

Onyx is the first system on the market designed to provide whole area non-destructive characterization of graphene, thin films, and other 2D materials. Bridges the gap between macro and nanoscale tools, characterizing from 0.5 mm² to large areas (m²), improving the industrialization of materials research.

Compared with other large-area methods, such as the four-probe method (destructive and contact), Onyx can measure the quality of the sample, providing a complete map of its surface for each electrical property being measured. Spatial resolution on the order of a few hundred microns allows rapid characterization of large sample areas, unlike microscopic methods such as Raman, SEM, and TEM.