We are very pleased to share that the international technical specification IEC TS 62607-6-10 has just been published by the International Electrotechnical Commision (IEC). The IEC TS 62607-6-10:2021 deals with the sheet resistance measurement of graphene-based materials using terahertz time-domain spectroscopy. das-Nano has co-leaded the drafting of the technical specification, in accordance with its commitment to standardization of terahertz technology.
Terahertz time-domain spectroscopy is a non-contact inspection method that is non-destructive, fast and robust for the mapping of large areas of graphene films, with no upper sample size limit. The method is applicable for statistical process control, comparison of graphene films produced by different vendors, or to obtain information about imperfections on the microscale.
das-Nano’s Onyx system, envisaged for the electrical characterization of graphene, among other materials, complies with the IEC TS 62607-6-10 technical specification. Onyx is the first system on the market designed to provide non-destructive full-area characterization of graphene, thin films and other 2D materials using terahertz waves.
If you are interested in collaborating in the international standardization of terahertz technology, do not hesitate to contact us.